Accelerated Simulation of ATM Switching Fabrics
نویسندگان
چکیده
We wish to estimate the cell loss ratio of a hot spot buffer buried deep in the fabric of an ATM switch. Since cell losses are rare events we cannot efficiently estimate the cell loss ratio using crude Monte-Carlo methods. We increase (twist) the workload of the hot spot to produce frequent cell losses. The twist is used with the splitting A-cycle sampling technique to efficiently estimate the cell loss ratio of the original system.
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